4 channel Digital Sampling Oscilloscope usable for Channel testing

As you are looking on this web page, your computer is rendering graphics, copying data from memory to storage devices and sending image data to your display. All of these data connections have one in common: they are using differential signaling on a serial link. Almost all of our today’s electronics use this method. Here are just some very familiar examples:

  • Serial ATA 3 up to 6 Gbit/s
  • PCI Express 2 up to 5.0 Gbit/s per lane
  • 10 Gigabit Ethernet up to 10 Gbit/s (4 differential pairs running at 2.5 Gbit/s each)
  • USB 3 up to 5 Gbit/s
  • HDMI 2.1 up to 48 Gbit/s

Since the datarates of these links increase year by year, it is hard to keep up and exessivly expensive to adopt the increasing signal speeds to your existing ATE. A 4x 24 Gbit/s connection, combined into a 100 Gbit/s link is just state of the art in 2017. What comes next?

With our High Speed Interconnect solution HSI-BERT and HSI-DSO you will get the tools you need to cope with today’s challenges of high speed signals by just upgrading your existing ATE at a feasable amount of investments.
4 channels

for Multi-Lane testing

32 GHz

Digital Sampling Scope

256 kSamples

Memory Depth

14 pS

Input Rise / Fall Time

Salland Engineering’s HSI-DSO-32 is a state of the art quadruple 32GHz Digital Sampling Oscilloscope. Its mechanical footprint fits in an TERADYNE UltraFLEX or ADVANTEST V93k stiffener, making it ideal for high volume productions testing. It also has all features required for full device characterization. It automatically performs accurate eye-diagram analysis to characterize the quality of transmitters and receivers. A statistical under-sampling technique is used with comprehensive software libraries for eye measurements, jitter analysis and processing of NRZ data.

General Features

  • ATE friendly interface
    • TERADYNE UltraFlex Stiffener with DSO Modules
    • Ultra compact form-factor enables high density testing
    • Low power consumption
    • Control multiple modules through ATE's Fast Ethernet or parallel bus
    • High throughput APIs for Linux and libraries for specific ATEs
    • APIs for LabView
  • MICROSOFT Windows-based Graphical User Interface
  • Repeatable performance and correlation to standards
  • Single-ended and differential electrical inputs
  • Data acquisition mode
    • Supports smart post processing on multiple acquisitions
    • Able to save data files for multiple DSOs working simultaneously
    • Data may be analyzed or loaded into simulator

DSO Measurements

  • Eye opening, eye height and width
  • Color graded persistence in eye and pattern capture modes
  • Amplitude, top, base, max, min, peak-peak
  • Rise/ fall time, single edge measurement in pattern capture
  • Crossing percentage
  • Pre-emphasis positive and negative (amplitude and width)
  • Total edge jitter and jitter analysis (deterministic and random)
  • Advanced pattern measurements
  • Zooming, markers, X and Y histograms, overlays and multiple statistics
  • Advanced mask margin capabilities
    • Mask margin and alternate mask margin rules available
    • Mask margin (positive or negative) can be extracted
    • Enables DUT quality assessment, control and binning
    • Returns number of failed points and values for a region

Key Features

  • Low cost quadruple 32 GHz Digital Sampling Scope optimized for high speed data analysis
  • High Fidelity Signal Capture
  • Low intrinsic Jitter
  • ATE friendly interface and user friendly GUI
  • Capability to save statistical measurement and data files for multiple DSOs
  • Single ended and di erential electrical inputs for each of the four units