Introducing the X750

The Teradyne J750 is a popular platform for testing micro-controllers and SOC devices where high parallel, multisite testing is required. Salland is proud to introduce a major new product to our family of ATE upgrade instruments that greatly extends the capabilities of the J750. Without sacrificing any digital slots, users can now run up to 640 additional independent device power supplies (DPS). Critical for IDDQ testing, additional enhancements deliver improved measurement accuracy of low currents in low voltage and high current applications.