| Efficient testing with enough tester resources Today cost efficiency is more important than ever. Many manufacturers are working on maximizing multi‑site testing. Often maximization can’t be done efficient because of limited tester resources. Salland Engineering introduces Multi-site Device Power Supply units (DPS) to extent existing ATE with up to 256+ independent DPS sources to enable real parallel testing. It offers FV, MI (including clamping control) possibilities, to be used for continuity, parametric IDD, IDDQ current measurements or just for powering devices. The SE-DPS instrument is targeted to reduce test costs for all kind of applications like for example; smart cards, memory, FPGA’s or DFT driven test approaches. Because the general setup it can be used in any application where many resources are required or were the original ATE supplies doesn’t meet the required specifications. A SE-DPS is a fully integrated with the original ATE SW and can be delivered for all kind of tester brands. For example for Teradyne IGXLTM or Advantest ATLTM based systems. DPS system The system consists of a 19-inch mainframe, with the system power supplies, control interface and DPS boards. The SE-DPS will be connected to the Device Interface Board (DIB) with special cables. A special control interface takes care of the control between the tester and the SE-DPS unit. This gives control capabilities for the current clamping, current measurement circuits, voltage references, calibration factors, limit value setting and relay switching. All settings can be controlled from the normal tester environment. The system comes with its own calibration and diagnostics SW to secure the functionality and accuracy. | 
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