SE-PROBE requires a PC running the Microsoft Windows environment and utilizes all standard hardware and software. All the necessary information like settings and wafer maps can easily be up- and downloaded through network connections. This allows you to retrieve actual real time production information like:

Real time wafer mapping

The Salland Engineering system graphically displays a wafer map, in real-time, with the correct aspect ratio.

The wafer map is displayed in full colour with zoom and panning options. The map can be scrolled, saved and printed. The wafer map engine is capable of reading maps given any industry standard formats.

SE-PROBE is an open system, which means that you can easily hook into certain events. Customer extension libraries can change the standard functionality of SE-PROBE. This allows the customer to change and/or add functionality to the existing system. The possibilities of this sophisticated system are almost unlimited. For example, you can integrate your prober into the company's data analysis and production flow network. Create sophisticated wafer analysis software to detect problem areas on your wafers potentially indicating Fabrication problems.

Built around wizards

In order to reduce set-up time and eliminate set-up errors the SE-PROBE system is built around various wizards.

The Control Map Wizard assists you to create a map with information such as die dimensions, probe pattern and sample test settings. The control map allows the testing of only specified areas on the wafer (sample sort).

The Production Wizard in SE-PROBE guides the operator through the production set-up process. The operator only has to specify the wafer to be probed. The wizard will automatically upload all the parameters to the wafer prober and will check each entry the operator makes. The Operator Wizard can use the OCR capabilities of your prober to automate the production set up.

Automatic report generation and off-line inking

SE-PROBE stores all its set-up data and production data in a Microsoft Access Database. This allows the user to generate automatic reports in Access or any other reporting tool that is capable of reading the Access Databases. Another important feature of SE-PROBE is off-line inking. Tell the Off-Line Inking Wizard which lot you want to ink and it will automatically retrieve information to load the correct wafer maps. If the wafer map files have been generated by another system the off-line inking wizard can read these files and load the corresponding set-up from the database. On-line inking can be done either during probing or directly after probing the wafer.

Quality & Security

SE-PROBE has the ability to enhance your production process by introducing features like Barcode and OCR reading capabilities, guaranteeing lot and wafer integrity.

The alternative to buying a new prober

The various standard SE-PROBE features have one thing in common. They add more functionality to your existing wafer prober and turn it into a user friendly, modern and flexible system which meets the highest demands of today.

SE-PROBE offers the ideal solution to increase the functionality and productivity of your test floor without the need to buy new probers.

SE-PROBE key features

• Real time wafer mapping
• Real time production control(yield, alarms)
• Multiple level probing (sampling)
• Off-line inking
• Ink-less probing
• Standard networking
• Remote monitoring

Software

• Real time production monitoring
• Graphical Wafer map, yield trend, binning. Graphical operator screens
• Graphical control map editor
• Set up wizards (eliminating set-up errors)
• Consecutive fail/bin monitoring
• Windows based software

For further information about SE-PROBE or other products and services of Salland Engineering, please call one of our offices.

home | about us | news | ate products | test program services | locations | jobs | feedback