New Features in SEDana 3.3b

Introduction

This page informs you about some of the new features in SEDana 3.3b:

• Windows Vista Compliant
• New SE-MapTool
• Sort on Part ID
• Automatic matching on part properties in R&R 
• Page based HTML report
• Update of the SEDana Help
• Numerous fixed issues and smaller improvements. For details refer to the release notes.

New SE-MapTool  

For effective multiple wafer map analysis we added the SE-MapTool to the SEDana Tools menu. This tool made his first appearance in the SEDana 3.2b release, but has now been updated with new features.

Comparing and contrasting a number of different wafer maps, is time consuming. This problem highlights the need for a solution, one that can analyze multiple data results and represent the information in
a range of different formats suited to the needs of the engineer.

The MapTool has the capacity to open multiple files in a single load. Empowering you with the option to compare multiple wafer maps easily and conveniently .
With a single click it offers the user in depth analysis of any wafer map that is available for analysis with features as:

Multiple loaded Wafer Maps Analysis First and Re-Probe Wafer Map Analysis Compare two Wafer Maps with ‘XOR’ and ‘AND’ function Stack Map Analysis, user can stack all odd even custom wafer numbers Easy Wafer Map view Zone Map view  GZIP file support

The SE-MapTool offers a flexible way to sort analyzed wafer maps in a number of different ways. You can sort by wafer number, or by yield or in descending or ascending priority.

This feature (available in the context menu of the Raw Table) allows the user to sort the data based on part ID. This happens in SEDana memory only, but the sorted data can be exported to a new CSV or STDF data set.

The Report Generator now has the possibility to create a page based HTML report with easy navigation. Also a thumbnail page, containing all generated plots has been added.

This feature is implemented as a new filter option. This offers the user to match parts in R&R analysis based on:

• Part ID (this is the default for backwards compatibility)
• Part Index (the location of the part after loading or (optional) sort on part)
• Wafer properties like X,Y coordinates and Wafer ID

The SEDana Help system has been updated and reviewed. The SEDana Assistant has been dropped in favor of a Compiled HTML Help file.

SEDana is a product of Salland Engineering the Netherlands. Click here for SEDana product information.

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